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Graphs Speed Unsymmetrical Flip-Flop.- Electr. Des. . Sept. 13 and 2Г, 1963. Беккер (Becker P. W.). Transformations on Probability Density Functions that Retain Marginals. - In: Paper presented at the International Siraposium on Information Theory. Nordwijk, The Netherlands, June 15-19, 1970. Беккер и Жаклер (Becker P. W. and Jarkler В.). A Systematic Procedure for the Generation of Cost-Minimized Designs. - 1ЕЕЕ Trans. , V. R-20, № 1. 1972. Беккер и Уорр (Becker P. W. and Warr R. E.). Reliability vs. Com-poment Tolerances in Microelectronic Circuits. - Proc. 1ЕЕЕ , V. 51, p. 1202-1214, Sept., 1963. Богуненко и Расщепляев (Bogunenko V. L. and Rasshcheplyay-ev Yu. S.). The Problem of Reducing Output Parameter Spreads in Electrical and Electronic Circuits. - Telecommun. and Radio Engin. , p. 28-33, June 1967. Бозик (Bozic S. M.). Microelectronic Realization and Circuits Properties of a Calculator. - M]croelectr. and ReUab. , v. 9, p. 283-286, 1970. Браччи и Сомалвнко (Bracchi G. and Somalvico M.). The Correlation Method for Computer-Aided Statistical Analysis.- 1ЕЕЕ Trans. , v. R-20, № 3, -1971. Броун и Мехони (Brown A. and Mahoney G.). Nonlinear Programming is Essential to the Designer in Optimizing Circuits.- Electr. Des. , v. 16, p. 90-95, Oct. 24, 1968. Брукс (Brooks S. H.). A discussion of Random Methods for Seeking Maxima. - Opns. Res.>, v. 6, p. 244-2&1, March, 1958. Бруум и Яиг (Broome Р. W. and Young P. J.), the Selection of Circuit Components of Optimum Circuit Reproducibility, - 1ЕЕЕ Trans.x.. V. CT-9, p. 18-23, March, 1962. Бусленко H. П., Шрейдер 10. A. Метод статистических испытаний (Монте-Карло) н его реализация на цифровых вычислительных машинах. М., Физматгиз, 1961. Вашбурн (Washburn L. А.). Determination of Optimum Burn-In Time: A composite Criterion. - 1ЕЕЕ Trans. , v. R-19, № 4, 1970. Вейбулл (VVeibuIl W.). A Statistical Disctribution Function of Wide Applirability. - J. Appl. Mech. , v. 18, Marcli, 1951. Вуд (Wood C. F.). Review of Design Optimization Techniques.- 1ЕЕЕ Trans. , v. SSC-1, p. 14-20, Nov. 1965. Гаккос и Штрахт (Guckos G. and Shuit M. J. O.). Comparative Reliability Tests on Silicon-Planar-Switching Transistors of European and U. S. Manufacture. - Microelectr. and ReHab. , V. 6, p. 143-162, Ni 2, 1967. Глоппер и Пирсон (Glopper С. S. and Pearson E. S.). The Use of Confidence or Fiducial Limits illustrated in a Case of The Binomial.- Bioinetrica , v. 26, № 9, 1934. Гехер (Geher K.)- Theory of Netviork Tolerances. Budapest, Hun-, gary, Akademia Kiado, 1971. Гнеденко Б. В., Беляев fO, К., Соловьев А. Д. Математические методы в теории надежности. М., Наука , 1965. Голдстик и Макки (Goldstick G. Н. and Mackie D. G.). Design of Computer Circuits Using Linear Programming Techniques.- 1ЕЕЕ Trans. , v. EC-Mi p. 512-530, Aug. 1962. Голомб (Golomb S. W.)- Mathematical Models: Uses and Limifa-tions. - 1ЕЕЕ Trans. , v. R-20, № 3, Aug. 1971. Грин и Боурн (Green A. E. and Bourne A. J.). Reliability Technology. Nevif York, Wiley-Inter Science, 1972. Гхани и Барнс (Ghany S. N. and Barnes L.). Parameter Optimization for Unconstrained Object Functions- a Bibliography. Computer Aided Design, p. 247-259, 1972. Даммер (Dummer G. W. A.). Failure Rates, Long Term -Changes and Failure Mechanisms of Electronics Components. - Electr. Сотр. , V. 5, p. 835-853, Oct. 1964. Дауни (Downey M. J.). Satellite Reliability. - Microelectr. and Re-liab. , V. 9, p. 271-282, 1970. де Кастро и др. (de Castro E., luculano G. and Monaco V. A.). Component Value Spread and Network Function Tolerances: An Optimal Design Procedure. - Acta Frequenz , v. XL, № 11, p. 867-872, 1971, Джайнес (Jaynes E. Т.). Prior Probabilities. - 1ЕЕЕ Trans; , V. SSC-4, Hs 3, Sept., 1968. Дынкин E. Б., Юшкевич A. A. Марковские процессы. М., Наука , 1967. Зеленцов (Zelentsov В. Р.). Reliability Analysis of Large Nonre-pairable Systems. - 1ЕЕЕ Trans. , v. R-ig, № 4, 1970. Йенсен (Jensen F.). Component Data For Statistical Circuit Analysis. - A1icroelectr. and Reliab. , v. 11, p. 79-85, 1972. Йенсен (Jensen F.). The Computation of Yield and Drift Reliability of Electronic Circuits. - Microelectr. and Reliab. , v. IT, p. 139-145, 1972. Кан и Маршалл (Kahn Н. and Marshall А. W.). Methods ot Reducing Sample Size in Monte-Carlo Computation. - Opns. Res. , V. I, № 5, 1953. Kao и Магнуссон (Kuo F. F. and Magnuson Jr., W. J. (Editors)). Computer Oriented Circuit Design. Prentice-Hall, 1969. Калахэн (Calahan D. A.). Computer-Aided Network Design. New York. McGraw-Hill Inc., 1972. Камензинд (Camenzind H. R.). Circuit Design for Integrated Electronics. Reading, Massachusetts, Addison-Wesley, 1968. Карафин (Karafin B. J.). The Optimum Assignment of Component Tolerances for Electrical Networks. - BSTJ , v. 50. № 4. 1972. Khm, Кейс и Гхэр (Kim Y. H., Case K. E. and Ghare P. M.). A Method for Computing Complex System Reliability.- 1ЕЕЕ Trans. , V. R-21., № 4, 1972. Кларк (Clark C. E.). Importance Sampling in Monte-Carlo Analysis.- Opens. Res. , V. 9, Ks 5, 1961. Клир и Валач (КИг J. and Valach M.). Cybernetic Modelling. Loudon, U. K. Illiffe Books Ltd., 1967. Клетцнер (KSotzner N. J.). Statistische Verfahren zur Analyse von Schaltungen. - NTZ . B, 18, p. 693-698, Dec. 1965. Ковалик и Осборн (Kowalik J. and Osborne M. R.). Methods for Unconstrained Optimization Problems. New York, Elsevier, 1968. KoKc Д. P., Смит В. Л. Теория восстановления. Пер, с англ. Под ред. Ю. К. Беляева. М., Сов. радио , 1967. Корн (Когп G. А.). Random Process Simulation and Measurements. New York, McGraw-Hill, 1966. Кочрен и др. (Cochran W. Т., Cooley J. W., Favin D. L., Helms H. D.. Kaenel R. A., Lang W. W., Maling G. C, Nelson D. E., Ra-der C. M. and Welch P. D.). What is The Fast Fourier Transform?- Ргос. 1ЕЕЕ , V. 55, № 10, p. Ii664-1674, Oct 1967. Кришнамурти и Комиссар (Krishnamurthy E. V. and Comissar G.). Computer - Aided Reliability Analysis of Comlicaled Networks.- 1ЕЕЕ Trans. , V. R-21, № 2, 1S72. Крон (Krohn C. A.). Reliability Analysis Techniques. - IRE , v, 48, p. 179-192, 1960. Kpoy и др. (Crow E. L., Davis F. A. and Maxfield M. W.). Statistics Manual With Examples Taken From Ordnance Development New York, Dover Publications Inc., p. 175-178, 1960. Kyx и Хадж (Kuh E. S. and Hujj I. N). Nonlinear Circuit Theory: Resistive Networks. - Ргос. 1ЕЕЕ , v. 59, № 3, March Г971. Кюнцн, Тжач и Зендер (Ktinzi И. P., Tzschach Н. G. and Zehn-der C. A.). Numerical Methods of Mathematical Optimisation. New York, Academic Press, 1971. Къелстрём (KjeUstr5m G.). Network Optimization by Random Variation of Component Values. - Ericsson Techn. , Кя 3, p. 133-151, 1969. Къелстрём (Kjellstrom G.). Optimization of Electrical Networks with Respect to Tolerance Costs. - Ericsson Techn. , № 3, p. 157-175, 1970. JlfeH (Ley B. J.). Computer-Aided Analsysis and Design for Electrical Engineers. 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